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Versatile AFM and Raman studies of Graphene Flakes

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Graphene flakes on gold substrate

AFM, KPFM, LFM, EFM, FMM, Raman and Rayleigh maps measured simultaneously by means of NTEGRA SPECTRA in upright configuration.

Data courtesy:
E. Kuznetsov, S. Timofeev, P. Dorozhkin, NT-MDT Co.


raman_g-line_x
raman_g-line_x
Confocal Raman map: G-band intensity

Confocal Raman microscopy.

G-band intensity map.
size: 30x30 um
rayleigh
Rayleigh
 Rayleigh
size: 30x30 um
r_1500-1668
Confocal Raman map: 2679-2770
 1500-1668 band
size: 30x30 um
skm
KPFM
 KPFM
size: 30x30 um
SPM principle: Kelvin Probe Force Microscopy
lfm
LFM
 LFM
size: 30x30 um
SPM principle: Lateral Force Imaging
height
Height
 AFM
size: 30x30 um
SPM principle: Intermittent contact mode
efm
EFM
 EFM
size: 30x30 um
SPM principle: EFM
phase
Phase

size: 30x30 um
SPM principle: Phase Imaging mode
fmm
FMM
 FMM
size: 30x30 um
SPM principle: Force Modulation microscopy

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